新皋企業股份有限公司 | Ample Goal - AFM Probes

Scanned URL: http://amplegoal.com.tw

97/100 Excellent

Last scanned: 2026-07-02

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• Profile | 新皋企業股份有限公司 | Ample Goal - AFM Probes
• PPP-QFMR -真空/UHV AFM 探針 | 新皋企業股份有限公司 | Ample Goal - AFM Probes — The PointProbe® Plus Q30K-Plus combines the well-known features of the proven PointProbe® Plus series such as a further reduced and more reproducible AFM tip radius (typical AFM tip radius less than 7 nm) as well as a more defined AFM tip shape with a high mechanical quality factor (Q-factor) under ultra high vacuum (UHV) conditions. The typical Q-factor of over 35000 under UHV conditions and the aluminum coating on the detector side provide excellent resolution and an enhanced signal to noise ratio. The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode under UHV conditions. Due to its high Q-factor and the typical features of the PPP series this AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
• Akiyama-Probe -Akiyama 自感測探針 | 新皋企業股份有限公司 | Ample Goal - AFM Probes — Akiyama-Probe is based on a quartz tuning fork combined with a micromachined AFM cantilever. The great advantage of this novel AFM probe is that one can benefit from both the tuning fork’s extremely stable oscillation and the silicon AFM cantilever’s reasonable spring constant with one AFM probe. Akiyama-Probe is equipped with a special version of the NANOSENSORS™ AdvancedTEC, a high-end sharp silicon AFM tip and has an excellent imaging capability on various samples with different properties, which is as high as that of a conventional optical lever system. Akiyama-Probe requires neither optical detection, nor an external shaker. Akiyama-Probe occupies only a small volume above the sample. These features make it very attractive for creating a new generation of scanning probe microscopy (SPM) instruments.

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